A model for the non - steady - state temperature behavior of semiconductor cooling system and its experimental analysis 半導(dǎo)體制冷系統(tǒng)非穩(wěn)態(tài)溫度工況的模型及實(shí)驗(yàn)分析
Semiconductor devices - mechanical and climatic test methods - steady - state temperature humidity bias life test 半導(dǎo)體器件.機(jī)械和氣候試驗(yàn)方法.穩(wěn)態(tài)溫度濕度偏差壽命試驗(yàn)
Semiconductor devices - mechanical and climatic test methods - part 5 : steady - state temperature humidity bias life test 半導(dǎo)體器件.機(jī)械和氣候試驗(yàn)方法.第5部分:穩(wěn)態(tài)溫度濕度偏差壽命試驗(yàn)
Semiconductor devices - mechanical and climatic test methods - part 5 : steady - state temperature humidity bias life test 半導(dǎo)體器件.機(jī)械和氣候試驗(yàn)方法.第5部分:穩(wěn)態(tài)溫度濕度偏差耐久性試驗(yàn)
Semiconductor devices - mechanical and climatic test methods - part 5 : steady - state temperature humidity bias life test iec 60749 - 5 : 2003 ; german version en 60749 - 5 : 2003 半導(dǎo)體器件.機(jī)械和氣候試驗(yàn)方法.第5部分:穩(wěn)態(tài)溫度濕